struct nvme_self_test_log - Device Self-test (Log Identifier 06h)

current_operation Current Device Self-Test Operation: indicates the status of the current device self-test operation. If a device self-test operation is in process (i.e., this field is set to #NVME_ST_CURR_OP_SHORT or #NVME_ST_CURR_OP_EXTENDED), then the controller shall not set this field to #NVME_ST_CURR_OP_NOT_RUNNING until a new Self-test Result Data Structure is created (i.e., if a device self-test operation completes or is aborted, then the controller shall create a Self-test Result Data Structure prior to setting this field to #NVME_ST_CURR_OP_NOT_RUNNING). See enumnvme_st_curr_op. completion Current Device Self-Test Completion: indicates the percentage of the device self-test operation that is complete (e.g., a value of 25 indicates that 25% of the device self-test operation is complete and 75% remains to be tested). If the current_operation field is cleared to #NVME_ST_CURR_OP_NOT_RUNNING (indicating there is no device self-test operation in progress), then this field is ignored. rsvd Reserved result Self-test Result Data Structures, see structnvme_st_result. August 2025 struct nvme_self_test_log libnvme(2)

struct nvme_self_test_log - Device Self-test (Log Identifier 06h)

struct nvme_self_test_log { __u8current_operation;__u8completion;__u8rsvd[2];structnvme_st_resultresult[NVME_LOG_ST_MAX_RESULTS]; };