nvme-micron-smart-add-log - Retrieves NAND statistics (2200 model drives) or Extended SMART information

       This command prints NAND information (Total bytes written, Bad block count and Erase failures etc) for
       the given micron device if its of 2200 model controller. For OCP complaint controllers this command print
       extended SMART health data along with NAND information (if available)

       The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a
       namespace block device (ex: /dev/nvme0n1).

       The -f option controls the displayed output data format based on the option value. If the option value is
       json (which is enabled by default), output data is printed in JSON format. If option value is normal the
       output is displayed in non-JSON format.

       This will only work on Micron devices devices of model numbers 54XX and OCP complaint controllers.
       Support for new devices may be added subsequently.

       •   Retrieve NAND/extended SMART data and display in json format

               # nvme micron vs-nand-stats /dev/nvme0

               * Retrieve NAND/extended SMART data and display in non-json format
               +

       # nvme micron vs-nand-stats /dev/nvme0 -f normal

           NVME

       Part of the nvme-user suite

NVMe                                               02/16/2025                               NVME-MICRON-SMART(1)

       nvme-micron-smart-add-log - Retrieves NAND statistics (2200 model drives) or Extended SMART information
       (OCP complaint models) of given micron device

       -f <json|normal>
           Controls the format of displayed output.

nvmemicronvs-smart-add-log <device> -f <json|normal>